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This instrument adopts the Transient Plane Source (TPS) method, based on TPS transient plane source technology, using a Hot Disk probe. The advantages of this instrument include:
(1) Direct measurement of heat propagation, saving a significant amount of time;
(2) Not affected by contact thermal resistance as in static methods;
(3) No special sample preparation is required. For solid materials, only a relatively flat sample surface is needed. Different types of materials use different testing schemes and mathematical models. It features fast measurement speed, wide applicability, and successfully avoids the influence of natural convection during the experiment. The instrument offers a broad range of test materials, wide thermal conductivity range, simple sample preparation, and fast testing speed, making it a currently popular testing method.
Equipment reference standards: ISO 22007-2:2008, GB/T 32064-2015.
Test materials: Metals, alloys, graphite, thermal greases, silicone gels, silicone rubbers, ceramics, geotechnical materials, rocks, polymers, paper, fabrics, foams, concrete, composite panels, paper honeycomb panels, and other solids, powders, liquids, pastes, coatings, films, insulation materials, thermal insulating materials, anisotropic materials, etc. Properties measured include thermal conductivity, thermal diffusivity, specific heat capacity, thermal storage coefficient, and thermal resistance.
Main Technical Parameters:
| 1. Thermal Conductivity Measurement Range | 0.001–500 W/(m·K),resolution: 0.0001 W/(m·K) |
| 2. Thermal Diffusivity Range | 0.1–100 mm²/s |
| 3. Thermal Storage Coefficient Range | 0.1–30 W/(m²·K) |
| 4. Specific Heat Capacity Range | 0.1–5 kJ/(kg·°C) |
| 5. Thermal Resistance Range | 0.5–0.000005 m²·K/W |
| 6. Temperature Measurement Accuracy | ≤0.0001°C |
| 7. Relative Measurement Error | ≤3% |
| 8. Repeatability Error | ≤3% |
| 9. Test Time | 1–120 seconds |
| 10.Sample Test Ambient Temperature Range | –40°C to +150°C
Standard configuration: room temperature Temperature control chambers for various high/low temperature ranges (–40°C to +150°C) or vacuum test conditions can be optionally provided as per customer requirements, with additional cost and to be agreed in the contract. |
| 11.Probe Configuration | Standard Configuration diameter Φ15 mm
Optional probe diameters as per customer requirements: Φ30 mm, Φ15 mm, Φ7.5 mm, Φ4 mm, or multiple sizes combined, with additional cost and to be agreed in the contract. |
| 12. Testing For Various Sample Types | a. Solid block or round, square, irregular samples: no special preparation required, only a relatively flat sample surface; equipped with dedicated sample clamping device.
b. Powders, pastes, liquids: no special requirements; equipped with dedicated sample test cells. c.Thin materials (thickness 0.01–1 mm): tested with dedicated test schemes and mathematical models. d.High-conductivity materials (100–500 W): tested with dedicated test schemes and mathematical models. e. Thermal insulation materials (0.010–0.050 W): tested with dedicated test schemes and mathematical models. |
| 13. Fully automatic test software for fast and accurate parameter analysis and report output during testing. | |
| 14.Power supply | AC 220V ±10%, 50/60 Hz
total power: <500 W |
Standard Configuration:
Dimensions and Weight:
Main unit: Benchtop (L × W × H): 400 × 450 × 450 mm; net weight: 20 kg.
© Dongguan Zhongli Instrument Technology Co., Ltd.
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